Regress Pro A scientific/industrial software that can be used to study experimental data
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study Experimental study experimental data spectroscopic ellipsometers spectroscopic reflectometers Regress

Regress Pro Description

A scientific/industrial software that can be used to study experimental data Regress Pro is scientific/industrial software that can be used to study experimental data coming from spectroscopic ellipsometers or reflectometers.Regress Pro has been developed mainly for the application of thin film measurement in the semiconductor industry.The software is suitable both to determine the thickness of the layers and to determine the optical properties of dielectric materials. Requirements: · GNU Scientific Library · FOX What's New in This Release: · Support has been added to fit multiple spectra at the same time with both shared and sample-specific fit parameters. This technique is of great importance in order in order to provide more robust results by checking model with multiple independent samples. · The grid search algorithm was also improved.

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